V. S. Balanethiram: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

1

High-velocity metal forming—An old technology addresses new problems

G. S. Daehn, M. Altynova, V. S. Balanethiram, G. Fenton, M. Padmanabhan, A. Tamhane, E. Winnard

Journal:

JOM Journal of the Minerals, Metals and Materials Society

Year:

1995

Language:

english

File:

PDF, 1006 KB

english, 1995

2

Static Thermal Coupling Factors in Multi-Finger Bipolar Transistors: Part II-Experimental Validation

Gupta, Aakashdeep, Nidhin, K, Balanethiram, Suresh, Yadav, Shon, Chakravorty, Anjan, Fregonese, Sebastien, Zimmer, Thomas

Journal:

Year:

2020

File:

PDF, 528 KB

2020

3

[IEEE 2017 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) - Miami, FL (2017.10.19-2017.10.21)] 2017 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) - Extracting the temperature dependence of thermal resistance from temperature-controlled DC measurements of sige HBTs

Balanethiram, Suresh, D'Esposito, Rosario, Fregonese, Sebastien, Zimmer, Thomas, Berkner, Jorg, Celi, Didier

Year:

2017

Language:

english

File:

PDF, 554 KB

english, 2017

4

[IEEE 2015 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Singapore, Singapore (2015.6.1-2015.6.4)] 2015 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Analysis of electro-thermal instability in bipolar transistors

Balanethiram, Suresh, Chakravorty, Anjan

Year:

2015

Language:

english

File:

PDF, 213 KB

english, 2015

5

[IEEE 2015 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Boston, MA, USA (2015.10.26-2015.10.28)] 2015 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Efficient modeling of static self-heating and thermal-coupling in multi-finger SiGe HBTs

Balanethiram, Suresh, Chakravorty, Anjan, D'Esposito, Rosario, Fregonese, Sebastien, Zimmer, Thomas

Year:

2015

Language:

english

File:

PDF, 172 KB

english, 2015

6

Enhanced formability of interstitial free iron at high strain rates

Balanethiram, V.S., Daehn, Glenn S.

Journal:

Scripta Metallurgica et Materialia

Year:

1992

Language:

english

File:

PDF, 408 KB

english, 1992

7

Efficient Modeling of Distributed Dynamic Self-Heating and Thermal Coupling in Multifinger SiGe HBTs

Balanethiram, Suresh, D'Esposito, Rosario, Chakravorty, Anjan, Fregonese, Sebastien, Celi, Didier, Zimmer, Thomas

Journal:

IEEE Transactions on Electron Devices

Year:

2016

Language:

english

File:

PDF, 1.55 MB

english, 2016

8

Thermal Penetration Depth Analysis and Impact of the BEOL Metals on the Thermal Impedance of SiGe HBTs

D'Esposito, Rosario, Balanethiram, Suresh, Battaglia, Jean-Luc, Fregonese, Sebastien, Zimmer, Thomas

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 604 KB

english, 2017

9

[IEEE 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Hangzhou, China (2016.10.25-2016.10.28)] 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Influence of the BEOL metallization design on the overall performances of SiGe HBTs

D'Esposito, R., De Matos, M., Fregonese, S., Balanethiram, S., Chakravorty, A., Aufinger, K., Zimmer, T.

Year:

2016

Language:

english

File:

PDF, 668 KB

english, 2016

10

[IEEE 2016 3rd International Conference on Emerging Electronics (ICEE) - Mumbai, India (2016.12.27-2016.12.30)] 2016 3rd International Conference on Emerging Electronics (ICEE) - Extracting the FEOL and BEOL components of thermal resistance in SiGe HBTs

Balanethiram, Suresh, Chakravorty, Anjan, D'Esposito, Rosario, Fregonese, Sebastien, Zimmer, Thomas

Year:

2016

Language:

english

File:

PDF, 370 KB

english, 2016

11

Extraction of BEOL Contributions for Thermal Resistance in SiGe HBTs

Balanethiram, Suresh, D'Esposito, Rosario, Chakravorty, Anjan, Fregonese, Sebastien, Zimmer, Thomas

Journal:

IEEE Transactions on Electron Devices

Year:

2017

Language:

english

File:

PDF, 1.33 MB

english, 2017

12

An Efficient Thermal Model for Multifinger SiGe HBTs Under Real Operating Condition

K, Nidhin, Pande, Shubham, Yadav, Shon, Balanethiram, Suresh, Nair, Deleep R., Fregonese, Sebastien, Zimmer, Thomas, Chakravorty, Anjan

Journal:

IEEE Transactions on Electron Devices

Year:

2020

File:

PDF, 1.76 MB

2020

13

[IEEE 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) - Penang, Malaysia (2020.4.6-2020.4.21)] 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) - Modeling Thermal Behavior in Multi-layered GaN HEMT-like Structures

Nidhin, K, Balanethiram, Suresh, Nair, Deleep R., Chakravorty, Anjan

Year:

2020

File:

PDF, 267 KB

2020

14

Hyperplasticity: Increased forming limits at high workpiece velocity

Balanethiram, V.S., Daehn, Glenn S.

Journal:

Scripta Metallurgica et Materialia

Year:

1994

Language:

english

File:

PDF, 501 KB

english, 1994

15

Validation of Thermal Resistance Extracted From Measurements on Stripe Geometry SiGe HBTs

Balanethiram, Suresh, D'Esposito, Rosario, Fregonese, Sebastien, Chakravorty, Anjan, Zimmer, Thomas

Journal:

IEEE Transactions on Electron Devices

Year:

2019

Language:

english

File:

PDF, 877 KB

english, 2019

16

A review of: “ Rapid Load Fracture Testing ” Edited by Ravinder Chona and William R. Corwin

Balanethiram, V.S.

Journal:

Materials and Manufacturing Processes

Year:

1994

Language:

english

File:

PDF, 138 KB

english, 1994

17

Analytic Estimation of Thermal Resistance in HBTs

Chakravorty, Anjan, D'Esposito, Rosario, Balanethiram, Suresh, Fregonese, Sebastien, Zimmer, Thomas

Journal:

IEEE Transactions on Electron Devices

Year:

2016

Language:

english

File:

PDF, 1.44 MB

english, 2016

18

Hyperplasticity: Enhanced formability at high rates

V.S. Balanethiram, Xiaoyu Hu, Marina Altynova, Glenn S. Daehn

Journal:

Journal of Materials Processing Technology

Year:

1994

Language:

english

File:

PDF, 496 KB

english, 1994

19

Accurate Modeling of Thermal Resistance for On-Wafer SiGe HBTs Using Average Thermal Conductivity

Balanethiram, Suresh, Chakravorty, Anjan, D'Esposito, Rosario, Fregonese, Sebastien, Celi, Didier, Zimmer, Thomas

Journal:

IEEE Transactions on Electron Devices

Year:

2017

Language:

english

File:

PDF, 1.10 MB

english, 2017

20

Static Thermal Coupling Factors in Multi-Finger Bipolar Transistors: Part IâModel Development

Gupta, Aakashdeep, Nidhin, K, Balanethiram, Suresh, Yadav, Shon, Chakravorty, Anjan, Fregonese, Sebastien, Zimmer, Thomas

Journal:

Year:

2020

File:

PDF, 587 KB

2020

To build up a library is to create a life. It’s never just a random collection of books.

— Carlos María Domínguez

Official channel

Z-Library Desktop Launcher

Z-Library Since 2009 support@1delivery.pm

EnglishРусскийEspañolItalianoελληνικάاللغة العربيةBahasa IndonesiaBahasa Malaysiaहिन्दीDeutschFrançaisPortuguêsУкраїнськаPolski中文繁體中文日本語Tiếng ViệtAzərbaycan DiliՀայոց լեզուภาษาไทยTürk Diliქართველიবাংলাپښتوతెలుగుاردو한국어SrpskiБългарски